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Tom Munns, Test Conference, Graeme, Dblp, Ieee, Test Development, Tim Wood, Scan...
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 Netherlands
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Philips Research, Erik Jan Marinissen, Core, Ieee, Sandeep Kumar Goel, Rohit Kapur...
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 California, United States
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Testability, Cisco Systems, Krzysztof Kuchcinski, Zebo Peng, Test Conference, Itc...
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Ibm, Austin, Abhishek Singh, Program Chair, Usa, Test Conference, Sani Nassif, Austin Research Lab...
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California, United States
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Michael Jones, Itc, San Jose, Test Conference, Miguel Conde, Electronic Edition Link Bibtex...
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Tom Jones, Office, Pheaa, Axis, Vice President And General Manager, Itc, Test Conference...
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California, United States
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Robert Madge, Brady Benware, Lsi Logic, Nagesh Tamarapalli, Kun Han Tsai, Dblp, Lu...
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Cadence Design Systems, Leendert, Huisman, Mick Tegethoff, Vivek Chickermane, Dblp...
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Cowen, Smallman, Military, Born Private, Test Conference, Itc, Unknown, Electronic Edition Ieee Computer Society...
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Texas, United States
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Nagesh Tamarapalli, Mark Kassab, Texas Instruments, Abu, Jayashree Saxena, Dblp...
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Multimedia, Plumbing, Spokesmanreview.com Tributes, Itc, Normaal, Test Conference...
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Philips Research, Silicon Debug, Bart Vermeulen, Pieter Van Der Wolf, Netherlands...
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Wang, Xiaoming Wang, Test Conference, Dblp, Baba, Academia Sinica, Lj¸çˆ¸ ƈ‘是ä½...
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California, United States
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Touba, University Of Texas, Austin, Santa Clara, Scan, Computer, Delay Faults, Fault Diagnosis...
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Massachusetts, United States
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Richard Lee, Ismet Bayraktaroglu, Amitava Majumdar, Bist For Board System Level...
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National Semiconductor, Mani Soma, Alan Chong, Karen Taylor, University, Lin, Alex Orailoglu...
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Massachusetts, United States
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Mike Ricchetti, Carl Barnhart, Bill Eklow, Dblp, Teradyne, Test Conference, Itc...
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New York, United States
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Richard Davies, Dilip, Bhavsar, Itc, Dblp, Test Conference, Intel, Chattanooga, Sayville...
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Stroud, Charles, Built In Pattern Generator, Auburn University, Dblp, Itc, Test Conference...
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Texas, United States
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Texas Instruments, Statecraft, International, Butler, Design, Dblp, Itc, Gordon Gammie...
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